built-in test circuit

built-in test circuit
цепь встроенного контроля

Англо-русский словарь по гражданской авиации. — М.: Скорпион-Россия. . 1996.

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Смотреть что такое "built-in test circuit" в других словарях:

  • Railway test circuit Velim — ( cz. Železniční zkušební okruh u Velimi or cz. Železniční zkušební okruh Cerhenice) is a closed railway used to test railway cars and locomotives.The circuit is part of the Test Center Velim ( Zkušební centrum Velim ), owned by Railway Research… …   Wikipedia

  • Circuit integrity — fireproofing of cable trays in Lingen/Ems, Germany using calcium silicate board system qualified to DIN 4102 …   Wikipedia

  • Circuit Ricardo Tormo — Circuit de Valencia redirects here. For the current Formula One European Grand Prix venue, see Valencia Street Circuit. Circuit de la Comunitat Valenciana Ricardo Tormo Location Cheste, Valencia, (Spain) …   Wikipedia

  • Circuit Paul Ricard — Paul Ricard High Tech Test Track Location Le Castellet, France Time zone GMT +1 (DST: +2) Coordinates …   Wikipedia

  • Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… …   Wikipedia

  • Built-in self-test — A built in self test (BIST)mechanism within an integrated circuit (IC) is a function that verifies all or a portion of the internal functionality of the IC. For example, a BIST mechanism is provided in advanced fieldbus systems to verify… …   Wikipedia

  • Circuit de la Sarthe — For the French road bicycle racing stage race, see Circuit de la Sarthe (cycling) Circuit des 24 Heures Circuit de la Sarthe Location Le Mans, France …   Wikipedia

  • Circuit de Catalunya — Coordinates: 41°34′12″N 2°15′40″E / 41.57°N 2.26111°E / 41.57; 2.26111 …   Wikipedia

  • Circuit de Spa-Francorchamps — Coordinates: 50°26′14″N 5°58′17″E / 50.43722°N 5.97139°E / 50.43722; 5.97139 …   Wikipedia

  • Circuit design — The process of circuit design can cover systems ranging from complex electronic systems all the way down to the individual transistors within an integrated circuit. For simple circuits the design process can often be done by one person without… …   Wikipedia

  • Built-in self-test — Un built in self test, souvent appelé par l acronyme BIST, est un mécanisme permettant à un système matériel ou logiciel[réf. nécessaire], ou comprenant les deux, de se diagnostiquer lui même. Le diagnostique peut être déclenché soit par l… …   Wikipédia en Français


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